PAVAN, Paolo
 Distribuzione geografica
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Continente #
NA - Nord America 34.456
AS - Asia 18.764
EU - Europa 15.219
SA - Sud America 1.917
AF - Africa 280
OC - Oceania 19
Continente sconosciuto - Info sul continente non disponibili 17
Totale 70.672
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Nazione #
US - Stati Uniti d'America 34.000
CN - Cina 5.872
SG - Singapore 5.623
GB - Regno Unito 4.431
IT - Italia 2.788
HK - Hong Kong 2.638
SE - Svezia 1.623
DE - Germania 1.593
BR - Brasile 1.491
VN - Vietnam 1.324
KR - Corea 1.023
FI - Finlandia 770
PL - Polonia 735
FR - Francia 727
UA - Ucraina 625
RU - Federazione Russa 572
TR - Turchia 570
IN - India 400
BG - Bulgaria 293
CA - Canada 245
NL - Olanda 245
PT - Portogallo 191
JP - Giappone 189
BD - Bangladesh 174
MX - Messico 141
AR - Argentina 139
TW - Taiwan 137
ID - Indonesia 128
IQ - Iraq 107
ES - Italia 105
ZA - Sudafrica 84
BE - Belgio 79
PK - Pakistan 79
IE - Irlanda 75
EC - Ecuador 72
AE - Emirati Arabi Uniti 71
CO - Colombia 64
MY - Malesia 60
CH - Svizzera 59
LT - Lituania 52
AT - Austria 51
PH - Filippine 47
MA - Marocco 43
SA - Arabia Saudita 42
CL - Cile 40
IL - Israele 39
VE - Venezuela 38
UZ - Uzbekistan 32
EG - Egitto 28
GR - Grecia 28
DZ - Algeria 24
IR - Iran 24
PY - Paraguay 24
CZ - Repubblica Ceca 23
JO - Giordania 23
LU - Lussemburgo 23
NP - Nepal 23
TH - Thailandia 23
TN - Tunisia 23
RO - Romania 22
PE - Perù 19
BY - Bielorussia 18
AZ - Azerbaigian 16
UY - Uruguay 16
KE - Kenya 15
AL - Albania 14
CR - Costa Rica 14
OM - Oman 14
DO - Repubblica Dominicana 13
HU - Ungheria 13
JM - Giamaica 13
AU - Australia 12
SN - Senegal 12
BO - Bolivia 11
EU - Europa 11
KZ - Kazakistan 11
ET - Etiopia 10
PS - Palestinian Territory 10
DK - Danimarca 9
NO - Norvegia 9
RS - Serbia 9
GE - Georgia 8
LB - Libano 8
BH - Bahrain 7
CG - Congo 7
NZ - Nuova Zelanda 7
SK - Slovacchia (Repubblica Slovacca) 7
TT - Trinidad e Tobago 7
AO - Angola 6
BB - Barbados 6
EE - Estonia 6
NG - Nigeria 6
QA - Qatar 6
HR - Croazia 5
KG - Kirghizistan 5
NI - Nicaragua 5
CY - Cipro 4
HN - Honduras 4
KW - Kuwait 4
MD - Moldavia 4
Totale 70.595
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Città #
Singapore 3.608
Fairfield 3.547
Southend 3.084
Ashburn 3.062
Santa Clara 2.957
Hong Kong 2.566
Hefei 2.431
Woodbridge 2.155
Chandler 1.850
Houston 1.843
Seattle 1.402
San Jose 1.304
Jacksonville 1.243
Wilmington 1.185
Cambridge 1.172
Ann Arbor 1.116
Chicago 965
Dearborn 870
Nyköping 870
London 794
Beijing 788
Seoul 787
Warsaw 714
Modena 531
The Dalles 527
Helsinki 519
Los Angeles 482
Ho Chi Minh City 449
San Diego 351
Council Bluffs 336
New York 323
Izmir 318
Hanoi 302
Grafing 299
Milan 281
Princeton 276
Sofia 276
Buffalo 224
Eugene 221
Lauterbourg 210
Des Moines 167
Boardman 165
Shanghai 149
Columbus 147
Moscow 146
Redwood City 145
Salt Lake City 143
Bremen 142
Dallas 142
São Paulo 141
Guangzhou 128
Munich 126
Bologna 122
Frankfurt am Main 122
Tokyo 119
Falkenstein 108
Rome 107
Orem 82
Chennai 80
Atlanta 74
Da Nang 68
Jakarta 68
Taipei 67
Tampa 63
Phoenix 60
Nanjing 58
Wuhan 58
Brooklyn 56
San Francisco 55
Kent 53
Reggio Emilia 50
Dublin 49
Paris 49
Haiphong 48
Elk Grove Village 47
Amsterdam 45
Montreal 45
Toronto 45
Baghdad 44
Rio de Janeiro 43
Brussels 42
Falls Church 42
Delfgauw 41
Denver 40
Dhaka 39
Zhengzhou 39
Dresden 38
Mexico City 38
Norwalk 38
Redondo Beach 38
Brantford 37
Johannesburg 37
Parma 35
Poplar 34
Turku 34
Hải Dương 33
Manchester 33
Nuremberg 33
Changsha 32
Jinan 32
Totale 50.599
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Nome #
A Complete Statistical Investigation of RTN in HfO₂-Based RRAM in High Resistive State 749
XBW s.r.l. - Mechatronic Solutions 739
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis 685
Unimore Resistive Random Access Memory (RRAM) Verilog-A Model 1.0.0 671
Leakage current in HfO2 stacks: from physical to compact modeling 480
Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges 473
Active Safety System with RF Energy Harvesting Capabilities for Industrial Applications using Interchangeable Implements 397
The Role of Carbon Doping on Breakdown, Current Collapse and Dynamic On-Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates 396
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design 388
A WSN System Powered by Vibrations to Improve Safety of Machinery with Trailer 386
250mV Input Boost Converter for Low Power Applications 384
Can NROM, a 2 Bit, Trapping Storage NVM Cell, Give a Real Challenge to Floating Gate Cells? 379
Photovoltaic scavenging systems: Modeling and optimization 372
A microscopic physical description of RTN current fluctuations in HfOx RRAM 372
Anomalous random telegraph noise and temporary phenomena in resistive random access memory 370
Recommended Methods to Study Resistive Switching Devices 368
Random telegraph noise: Measurement, data analysis, and interpretation 367
A Compact Model of Hafnium-Oxide-Based Resistive Random Access Memory 365
Comprehensive physical modeling of forming and switching operations in HfO2 RRAM devices 362
Threshold Voltage Statistical Variability and Its Sensitivity to Critical Geometrical Parameters in Ultrascaled InGaAs and Silicon FETs 357
A new compact DC model of floating gate memory cells without capacitive coupling coefficients 355
An autonomous wireless sensor network device powered by a RF energy harvesting system 355
AlN-based MEMS devices for vibrational energy harvesting applications 354
The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs 352
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory 347
Prediction of impact-ionization-induced snap-back in advanced Si n-p-n BJTs by means of a non-local analytical model for the avalanche multiplication factor 342
Effects of Border Traps on Transfer Curve Hysteresis and Split-CV Mobility Measurement in InGaAs Quantum-Well MOSFETs 342
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations 342
A Solar Energy Harvesting Circuit for Low Power Applications 341
A new experimental technique for extracting base resistance and characterizing current crowding phenomena in bipolar transistors 340
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements 338
Understanding current instabilities in conductive atomic force microscopy 331
Photovoltaic Cell Modeling for Solar Energy Powered Sensor Networks 331
Temperature impact on the reset operation in HfO2 RRAM 329
A multi-scale methodology connecting device physics to compact models and circuit applications for OxRAM technology 329
A Novel Program-Verify Algorithm for Multi-Bit Operation in HfO2 RRAM 329
A consistent picture of cycling dispersion of resistive states in HfOx resistive random access memory 325
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 324
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting 324
Charge transport in high-k stacks for charge-trapping memory applications: A modeling perspective (invited) 322
Optimized Energy-Aware Wireless System for Identification of the Relative Positioning of Articulated Systems in the Free Space 321
embit s.r.l. 321
Combined variability/sensitivity analysis in III-V and silicon FETs for future technological nodes 320
Control of brushless DC motor with static redundancy for force-feedback in steer-by-wire applications 318
A study on HfO2 RRAM in HRS based on I–V and RTN analysis 317
A Vibration-Powered Wireless System to Enhance Safety in Agricultural Machinery 317
Force Feedback in Steer-by-Wire Systems: Architecture and Experimental Results 315
On the impact of channel compositional variations on total threshold voltage variability in nanoscale InGaAs MOSFETs 314
Progresses in Modeling HfOx RRAM Operations and Variability 312
Solar Energy Harvesting: applicazioni a bassa potenza 311
Enhancing Safety in Vehicles with Implement or Trailer using an Autonomous Wireless Sensor Network System 311
Mixed-Mode Stress in Silicon-Germanium Heterostructure Bipolar Transistors: Insights from Experiments and Simulations 311
A new compact Spice-like model of E2PROM Memory cells suitable for DC and transient simulations 309
Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modeling 309
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices 308
An Ultra-Low Cost Triboelectric Flowmeter 308
Charge Transport and Degradation in HfO2 and HfOx Dielectrics 307
RTN analysis with FHMM as a tool for multi-trap characterization in HfOx RRAM 307
Force Impact Effect in Contact-Mode Triboelectric Energy Harvesters: Characterization and Modeling 306
A Physics-Based Model of the Dielectric Breakdown in HfO2 for Statistical Reliability Prediction 304
Physical modeling and characterization of thermo-acoustic loudspeakers made of silver nano-wire films 304
“Hole Redistribution” Model Explaining the Thermally Activated RON Stress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs 303
Ultra low cost triboelectric energy harvesting solutions for embedded sensor systems 300
Solar harvesting per reti di sensori wireless 298
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control 298
Random dopant fluctuation variability in scaled InGaAs dual-gate ultra-thin body MOSFETs: source and drain doping effect 298
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods 298
Analysis of interface-trap effects in inversion-type InGaAs/ZrO2 MOSFETs 298
On the RESET-SET transition in Phase Change Memories 296
Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations 294
A memory window expression to evaluate the endurance of ferroelectric FETs 294
Random Telegraph Noise in Resistive Random Access Memories: Compact Modeling and Advanced Circuit Design 293
Variability and sensitivity to process parameters variations in InGaAs Dual-Gate Ultra-Thin Body MOSFETS: A scaling perspective 292
RTS Noise Characterization of HfOx RRAM in High Resistive State 291
Monitoring Stress-Induced Defects in HK/MG FinFETs Using Random Telegraph Noise 290
Energetic Approach for Steer-by-Wire in Off-highway Vehicles 290
A complete model of (EPROM)-P-2 memory cells for circuit simulations 290
Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach 288
A new model of gate capacitance as a simple tool to extract MOS parameters 287
Characterization and TCAD Modeling of Mixed-Mode Stress Induced by Impact Ionization in Scaled SiGe HBTs 287
Random Telegraph Noise analysis to investigate the properties of active traps of HfO2-Based RRAM in HRS 286
Control of Brushless Motor with Hybrid Redundancy for Force Feedback in Steer-by-Wire Applications 286
An Empirical Model for RRAM Resistance in Low- and High-Resistance State 286
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise 285
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules 284
A complete radiation reliability software simulator 284
Statistical simulations to inspect and predict data retention and program disturbs in Flash memories 283
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS 283
Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs 283
A New Compact Model of Floating Gate Non-Volatile Memory Cells 282
Energy-efficient logic-in-memory I-bit full adder enabled by a physics-based RRAM compact model 282
Statistical analysis of random telegraph noise in HfO2-based RRAM devices in LRS 281
An investigation on the role of current compliance in HfO2-based RRAM in HRS using RTN and I-V data 281
Circuit reliability of low-power rram-based logic-in-memory architectures 280
W2TS: A novel IEEE 802.11 multi-hop mesh network for tracking systems 279
Modelling nanoscale n-MOSFETs with III-V compound semiconductor channels: From advanced models for band structures, electrostatics and transport to TCAD 278
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: experiments and simulations 277
Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy 275
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization 275
Study of RRAM-Based Binarized Neural Networks Inference Accelerators Using an RRAM Physics-Based Compact Model 274
Totale 33.571
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Categoria #
all - tutte 255.675
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 255.675
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20212.045 0 0 0 0 0 0 0 0 0 1.134 460 451
2021/20225.508 365 589 401 267 135 677 212 279 550 461 1.111 461
2022/20235.337 538 623 292 478 675 854 137 538 641 67 301 193
2023/20243.881 191 202 222 395 903 383 301 420 81 187 143 453
2024/202514.458 981 215 207 915 2.119 1.973 1.023 865 1.315 615 2.337 1.893
2025/202619.777 1.820 1.213 1.747 1.930 3.039 2.302 2.621 982 2.284 1.839 0 0
Totale 71.158