TONDELLI, LISA
TONDELLI, LISA
Dipartimento di Ingegneria "Enzo Ferrari"
Assessment of Advanced Nanoscale Bulk FinFET's Self-Heating accounting for degraded thermal conductivity at the nanoscale
2023 Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca
Assessment of dual-oxide options for LDMOS transistors in FinFET technology
2026 Ruggieri, Alessandro; Tondelli, Lisa; Selmi, Luca
Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology
2024 Dinh, T. V.; Tam, S-W.; Scholten, A. J.; Tondelli, L.; Pijper, R. M. T.; Kondapalli, S. H.; Xie, J.; Wong, A.; To, I.; Asanovski, R.; Selmi, L.
Distinct Signatures of Self-Heating and Trap Dynamics on the AC Y-Parameters of Advanced n-MOSFETs
2025 Tondelli, L.; Scholten, A. J.; Van Beurden, J.; Pijper, R. M. T.; Asanovski, R.; Dinh, T. V.; Selmi, L.
Layout effects on the thermal metrics of multichannel FinFETs
2025 Tondelli, L.; Scholten, A. J.; Dinh, T. V.; Selmi, L.
Modellazione e Caratterizzazione Termica in Regime Statico e DInamico in FDSOI MOSFET e FinFET nanoscopici
2026 Tondelli, Lisa
Novel 3.3V RF-LDMOS in 16nm FinFET with the best RF and reliability trade-off enabling integrated Watt-level power amplifiers in connectivity SoC
2026 Viet Dinh, Thanh; Pronin, Nick; Ruggieri, Alessandro; H Both, Thiago; H Perera, Asanga; Dieball, Oliver; Pijper, R. M. T.; Swanenberg, M.; Xie, J.; Tondelli, Lisa; Selmi, Luca
On the design of LDMOS finFETs in advanced technology nodes
2024 Ruggieri, Alessandro; Tondelli, Lisa; Asanovski, Ruben; Selmi, Luca
On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices
2024 Tondelli, L.; Scholten, A. J.; Asanovski, R.; Pijper, R. M. T.; Dinh, T. V.; Selmi, L.
Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes
2024 Tondelli, L.; Asanovski, R.; Scholten, A. J.; Dinh, T. V.; Tam, S. -W.; Pijper, R. M. T.; Selmi, L.