Relazione in Atti di Convegno: [15160] Home page tipologia

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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 10.841 a 10.860 di 15.160
Titolo Data di pubblicazione Autore(i) File
A Passivity-Based Decentralized Approach for the Bilateral Teleoperation of a Group of UAVs with Switching Topology 1-gen-2011 A., Franchi; P., Robuffo Giordano; Secchi, Cristian; H. I., Son; H. H., Bülthoff
Il Decameron tra divagazione e conoscenza 1-gen-2012 Menetti, Elisabetta
Numerical analisys of Weakly turbulent mixed convection flows in a horizontal pipe 1-gen-2012 Errico, Orsola; Angeli, Diego; Barozzi, Giovanni Sebastiano; Stalio, Enrico; Corticelli, Mauro Alessandro
RF to DC CMOS rectifier with high efficiency over a wide input power range for RFID applications 1-gen-2012 Scorcioni, Stefano; Bertacchini, Alessandro; Larcher, Luca; Ricciardi, Antonio; Dondi, Denis; Pavan, Paolo
PROJECT MANAGEMENT IN THE FIELD OF UNDERGROUND WASTE COLLECTION SYSTEMS: DESIGN PRODUCTION AND INSTALLATION OF A CUSTOMIZED ITEM 1-gen-2011 Rimini, Bianca; Gamberini, Rita; Grassi, Andrea; Galloni, Luca; De Rosa, A.; Reggiani, E.
The dependence of latch-up sensitivity on layout and technology features, as analyzed by electrical measurements, HFIELDS and SPICE simulations, and infrared microscopy characterization 1-gen-1990 E., Zanoni; G., Spiazzi; Pavan, Paolo; M., Cecchetti; M., Muschitiello
Transiently triggered latch-up in CMOS twin-tub and epitaxial technologies 1-gen-1991 Pavan, Paolo; P., Caprara; B., Bonati; E., Zanoni
Adjacent structure interactions in latch-up dc triggering of CMOS twin-tub and epitaxial technologies 1-gen-1991 Pavan, Paolo; Zanoni, E.; Menozzi, R.; Selmi, L.
Impact ionization and light emission phenomena in AlGaAs/GaAs HBT's 1-gen-1992 Pavan, Paolo; E., Zanoni; L., Vendrame; R., Malik; S., Bigliardi; M., Manfredi; A., Di Carlo; P., Lugli; C., Canali
Simulating total dose radiation effects on circuit behavior 1-gen-1994 R., Tu; G., Lum; Pavan, Paolo; P. K., Ko; C., Hu
Ascorbyl radical is detected in rat isolated hepatocytes suspensions undergoing oxidative stress: an early index of oxidative damage in cells 1-gen-1989 Tomasi, Aldo; E., Albano; A., Bini; Iannone, Anna; V., Vannini
Simulating single event upset error rate in large digital circuits 1-gen-1994 Pavan, Paolo; E., Minami; R., Tu; P. K., Ko; C., Hu
Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors 1-gen-1996 A., Neviani; Pavan, Paolo; A., Chantre; M., Stucchi; T., Tommasin; L., Vendrame; E., Zanoni
Analysis of charge storage in the base of bipolar transistors and its influence on the parasitic resistance adopting an eight terminal Kelvin test structure 1-gen-1996 S., Asti; T., Cavioni; A., Neviani; Pavan, Paolo; M., Stival; L., Vendrame; E., Zanoni
HBM and CDM ESD stress test results in 0.6 μm CMOS structures 1-gen-1997 G., Meneghesso; N., Grapputo; P., Colombo; M., Brambilla; Pavan, Paolo; E., Zanoni
Characterization of CMOS structures (0.6 um process) submitted to HBM and CDM ESD stress tests 1-gen-1997 G., Meneghesso; Colombo, P.; M., Brambilla; R., Annunziata; Pavan, Paolo; E., Zanoni
Bluetooth embedded systems for home automation 1-gen-2003 F., Bonizzi; G., Finelli; F., Giva; L., Sedoni; U., Manzoli; R., Morselli; Pavan, Paolo
Control-Oriented Dynamic Modeling and Characterization of Magnetorheological Dampers 1-gen-2009 Spaggiari, Andrea; Dragoni, Eugenio
Resistenza in modo misto di adesivo in strato sottile: caratterizzazione sperimentale attraverso un nuovo provino tubolare 1-gen-2011 Spaggiari, Andrea; Castagnetti, Davide
Ettore Passerin d'Entrèves e la ricerca di uno storicismo personalista 1-gen-2011 De Giorgi, Fulvio
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 10.841 a 10.860 di 15.160
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Tipologia
  • Atti di CONVEGNO15159
  • Contributo su VOLUME1
Autore
  • CUCCHIARA, Rita459
  • ZAMBONELLI, Franco281
  • SELMI, LUCA228
  • FANTUZZI, Cesare217
  • GUNDUZ, Deniz215
  • FERRARI, Fabrizio212
  • BERGAMASCHI, Sonia203
  • SECCHI, Cristian195
  • LARCHER, Luca186
  • PALESTRI, Pierpaolo176
Data di pubblicazione
  • 2020 - 20272920
  • 2010 - 20195605
  • 2000 - 20094757
  • 1990 - 19991488
  • 1980 - 1989359
  • 1970 - 197930
  • 1967 - 19691
Editore
  • Institute of Electrical and Elect...1382
  • IEEE1015
  • IEEE Computer Society383
  • Springer Science and Business Med...268
  • Springer248
  • -235
  • Springer Verlag205
  • SAE International200
  • CEUR-WS129
  • SPRINGER-VERLAG BERLIN100
Rivista
  • SAE TECHNICAL PAPER202
  • JOURNAL OF PHYSICS. CONFERENCE SE...97
  • ...SUMMER SCHOOL FRANCESCO TURCO....64
  • POS PROCEEDINGS OF SCIENCE41
  • ACTA HORTICULTURAE35
  • ENERGY PROCEDIA29
Serie
  • LECTURE NOTES IN COMPUTER SCIENCE411
  • CEUR WORKSHOP PROCEEDINGS166
  • PROCEEDINGS OF SPIE, THE INTERNAT...160
  • LECTURE NOTES IN ARTIFICIAL INTEL...85
  • LECTURE NOTES IN MECHANICAL ENGIN...83
  • COMMUNICATIONS IN COMPUTER AND IN...71
  • IFAC-PAPERSONLINE71
  • PROCEEDINGS OF THE ANNUAL CONFERE...67
  • IFAC PROCEEDINGS VOLUMES65
  • TECHNICAL DIGEST - INTERNATIONAL ...64
Keyword
  • Electrical and Electronic Enginee...166
  • -160
  • Control and Systems Engineering104
  • Software86
  • Industrial and Manufacturing Engi...85
  • Computer Networks and Communications72
  • Computer Science (all)72
  • Computer Science Applications1707...72
  • CFD67
  • Artificial Intelligence63
Lingua
  • eng11915
  • ita2958
  • fre119
  • ger63
  • spa58
  • por15
  • rus12
  • und8
  • cat5
  • chi2
Accesso al fulltext
  • no fulltext10116
  • reserved2989
  • open1928
  • partially open118
  • embargoed9