Relazione in Atti di Convegno: [15160] Home page tipologia

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Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.941 a 6.960 di 15.160
Titolo Data di pubblicazione Autore(i) File
Design of UWB LNA in 45nm CMOS Technology: Planar Bulk vs. FinFET 1-gen-2008 D., Ponton; Palestri, Pierpaolo; Esseni, David; Selmi, Luca; M., Tiebout; B., Parvais; G., Knoblinger
Monte Carlo Simulation of Decananometric Double-Gate SOI devices: Multi-Subband vs. 3D-Electron Gas with Quantum Corrections 1-gen-2006 Riolino, I; Braccioli, M; Lucci, L; Esseni, David; Fiegna, C; Palestri, Pierpaolo; Selmi, Luca
2D h-BN based RRAM devices 1-gen-2016 Puglisi, Francesco Maria; Larcher, Luca; Pan, C.; Xiao, N.; Shi, Y.; Hui, F.; Lanza, M.
An Optimization Model to Reduce Energy Consumption in Software-Defined Data Centers 1-gen-2018 Canali, Claudia; Lancellotti, Riccardo; Shojafar, Mohammad
Experimental Signature and Physical Mechanisms of Substrate Enhanced Gate Current in MOS Devices 1-gen-1998 Esseni, David; Selmi, Luca
A Test Pattern to Investigate the Effect of Capping Layers on the Hot Carrier Induced Photon Spectra of MOSFET’s 1-gen-1994 Lanzoni, M; Selmi, Luca; Bez, R; Manfredi, M.
A Monte Carlo Technique to Investigate Signal Delays of Advanced Si BJT's up to High Currents 1-gen-2000 Palestri, Pierpaolo; Selmi, Luca; G. A. M., Hurkx; J. W., Slotboom
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 1-gen-1990 Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Ricco, B.
Simulation of nano-biosensors based on conventional TCAD 1-gen-2013 Palestri, Pierpaolo; Sette, R; Pittino, Federico; Saccon, F; Esseni, David; Selmi, Luca
Can Photon Emission / Absorption Processes Explain the Substrate Current of Tunneling MOS Capacitors? 1-gen-2001 Dalla Serra, A.; Palestri, Pierpaolo; Selmi, Luca
A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations 1-gen-2000 Dalla Serra, Alberto; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca
LC-Oscillator featuring independent Gate biasing implemented in 32 nm CMOS technology 1-gen-2010 Ponton, Davide; Palestri, Pierpaolo; Knoblinger, G; Fulde, M; Selmi, Luca
Validity of the effective mass approximation in silicon and germanium inversion layers 1-gen-2006 Van Der Steen, J. L.; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Study of defects in Al2O3 blocking layers of TANOS memories by atomistic simulation, electrical characterization and physico-chemical material analyses 1-gen-2011 Masoero, L.; Molas, G.; Blaise, P.; Colonna, J. P.; Vianello, Elisa; Selmi, Luca; Papon, A. M.; Lafond, D.; Martin, F.; Gely, M.; Licitra, C.; Barnes, J. P.; Ghibaudo, G.; De Salvo, B.
Understanding the mobility reduction in MOSFETs featuring high-κ dielectrics 1-gen-2010 Toniutti, Paolo; De Michielis, Marco; Palestri, Pierpaolo; Driussi, Francesco; Esseni, David; Selmi, Luca
Experimental and Simulation Study of the Biaxial Strain and Temperature dependence of the Electron Mobility Enhancement in Si MOSFETs 1-gen-2007 Driussi, Francesco; Esseni, David; Selmi, Luca; P. E., Hellstrom; G., Malm; J., Hallstedt; M., Ostling; T. J., Grasby; D. R., Leadley; X., Mescot
Experimental Evidence and Statistical Modeling of Cooperating Defects in Stressed Oxides 1-gen-2004 Driussi, Francesco; Esseni, David; Selmi, Luca; Van Duuren, M. J.; Widdershoven, F.
Multi-Subband-Monte-Carlo investigation of the mean free path and of the kT layer in degenerated quasi ballistic nanoMOSFETs 1-gen-2006 Palestri, Pierpaolo; Clerc, R; Esseni, David; Lucci, Luca; Selmi, Luca
Extraction of the Series Resistances and Effective Channel Length of GaAs MESFETs by means of Electrical Methods 1-gen-1991 Menozzi, R; Selmi, Luca; Gandolfi, A; Ricco, B.
Device variability and correlation control by automated tuning of SPICE cards to PCM measurements 1-gen-2011 Revelant, Alberto; Lucci, Luca; Selmi, Luca; Ankele, B.
Prodotti della tipologia (ordinati per Data di deposito in Decrescente ordine): 6.941 a 6.960 di 15.160
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Scopri
Tipologia
  • Atti di CONVEGNO15159
  • Contributo su VOLUME1
Autore
  • CUCCHIARA, Rita459
  • ZAMBONELLI, Franco281
  • SELMI, LUCA228
  • FANTUZZI, Cesare217
  • GUNDUZ, Deniz215
  • FERRARI, Fabrizio212
  • BERGAMASCHI, Sonia203
  • SECCHI, Cristian195
  • LARCHER, Luca186
  • PALESTRI, Pierpaolo176
Data di pubblicazione
  • 2020 - 20272920
  • 2010 - 20195605
  • 2000 - 20094757
  • 1990 - 19991488
  • 1980 - 1989359
  • 1970 - 197930
  • 1967 - 19691
Editore
  • Institute of Electrical and Elect...1382
  • IEEE1015
  • IEEE Computer Society383
  • Springer Science and Business Med...268
  • Springer246
  • -235
  • Springer Verlag205
  • SAE International200
  • CEUR-WS129
  • SPRINGER-VERLAG BERLIN100
Rivista
  • SAE TECHNICAL PAPER202
  • JOURNAL OF PHYSICS. CONFERENCE SE...97
  • ...SUMMER SCHOOL FRANCESCO TURCO....64
  • POS PROCEEDINGS OF SCIENCE41
  • ACTA HORTICULTURAE35
  • ENERGY PROCEDIA29
Serie
  • LECTURE NOTES IN COMPUTER SCIENCE411
  • CEUR WORKSHOP PROCEEDINGS166
  • PROCEEDINGS OF SPIE, THE INTERNAT...160
  • LECTURE NOTES IN ARTIFICIAL INTEL...85
  • LECTURE NOTES IN MECHANICAL ENGIN...81
  • COMMUNICATIONS IN COMPUTER AND IN...71
  • IFAC-PAPERSONLINE71
  • PROCEEDINGS OF THE ANNUAL CONFERE...67
  • IFAC PROCEEDINGS VOLUMES65
  • TECHNICAL DIGEST - INTERNATIONAL ...64
Keyword
  • Electrical and Electronic Enginee...166
  • -160
  • Control and Systems Engineering104
  • Software86
  • Industrial and Manufacturing Engi...85
  • Computer Networks and Communications72
  • Computer Science (all)72
  • Computer Science Applications1707...72
  • CFD67
  • Artificial Intelligence63
Lingua
  • eng11915
  • ita2958
  • fre119
  • ger63
  • spa58
  • por15
  • rus12
  • und8
  • cat5
  • chi2
Accesso al fulltext
  • no fulltext10116
  • reserved2989
  • open1928
  • partially open118
  • embargoed9