Tuneable phase plates for free electrons are a highly active area of research. However, their widespread implementation, similar to that of spatial light modulators in light optics, has been hindered by both conceptual and technical challenges. A specific technical challenge involves the need to minimize obstruction of the electron beam by supporting films and electrodes. Here, we describe numerical and analytical mathematical frameworks for three-dimensional stacks of phase plates that can be used to provide near-arbitrary electron beam shaping with minimal obstruction.
Three-dimensional Stacking of Phase Plates for Advanced Electron Beam Shaping / Ruffato, Gianluca; Beleggia, Marco; Tavabi, Amir Hossein; Rotunno, Enzo; Viani, Lorenzo; Rosi, Paolo; Kavkani, Payam Habibzadeh; Chiari, Caterina; Frabboni, Stefano; Gazzadi, Gian Carlo; Pozzi, Giulio; Bertoni, Giovanni; Tiemeijer, Peter; Dunin-Borkowski, Rafal Edward; Grillo, Vincenzo. - In: MICROSCOPY AND MICROANALYSIS. - ISSN 1435-8115. - 31:1(2025), pp. 1-11. [10.1093/mam/ozae108]
Three-dimensional Stacking of Phase Plates for Advanced Electron Beam Shaping
Ruffato, Gianluca;Beleggia, Marco;Rotunno, Enzo;Viani, Lorenzo;Rosi, Paolo;Kavkani, Payam Habibzadeh;Chiari, Caterina;Frabboni, Stefano;Gazzadi, Gian Carlo;Pozzi, Giulio;Grillo, Vincenzo
2025
Abstract
Tuneable phase plates for free electrons are a highly active area of research. However, their widespread implementation, similar to that of spatial light modulators in light optics, has been hindered by both conceptual and technical challenges. A specific technical challenge involves the need to minimize obstruction of the electron beam by supporting films and electrodes. Here, we describe numerical and analytical mathematical frameworks for three-dimensional stacks of phase plates that can be used to provide near-arbitrary electron beam shaping with minimal obstruction.
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris
